R4RIN – MCQs, Mock Tests | Analytical instruments Analytical Instrumentation MCQ Question Set 13

532.5 eV matches which of the following specific atom type?

1. Carbon
2. Oxygen
3. Nitrogen
4. Argon

✅ Correct Answer: 2

By studying which of the following can we determine if the surface corresponds to C-O or C=O chemical form?

1. Mass of the electron
2. Energy of the carbon peak
3. Binding energy
4. Charge of electron

✅ Correct Answer: 2

Which of the following is the detection limit of ESCA?

1. 0.1% monolayer
2. 0.5% monolayer
3. 1% monolayer
4. 2% monolayer

✅ Correct Answer: 1

The characterisation of auger spectroscopy can be achieved up to which of the following depths?

1. 1 nm
2. 2 nm
3. 4 nm
4. 8 nm

✅ Correct Answer: 1

Auger electron spectroscopy can be used for surface chemical analysis in a way similar to which of the following?

1. ESCA
2. SIMS
3. ISS
4. Ion spectroscopy

✅ Correct Answer: 1

AES is limited when it comes to very high resolution studies.

1. True
2. False
3. all of the above
4. None of the mentioned

✅ Correct Answer: 1

Qualitative chemical analysis is very often performed using which of the following?

1. ESCA
2. SIMS
3. AES
4. Ion spectroscopy

✅ Correct Answer: 3

Electron ionization can produce which of the following?

1. ESCA electron
2. Auger electron
3. Ion
4. Photon

✅ Correct Answer: 2

Electron ionisation can produce ESCA electrons.

1. True
2. False
3. all of the above
4. None of the mentioned

✅ Correct Answer: 2

Which of the following is an Auger transition starting from a hole in 1s levels which would be filled up from the 2p level?

1. KLM transition
2. KLL transition
3. LMN transition
4. LLM transition

✅ Correct Answer: 2

In ESCA process, the photon ejects which of the following?

1. 1s electron
2. 1p electron
3. 2s electron
4. 2p electron

✅ Correct Answer: 1

In Auger process, an electron drops to fill which of the following?

1. 1s hole
2. 1p hole
3. 2s hole
4. 2p hole

✅ Correct Answer: 1

Auger electron spectroscopy involves the irradiation of the surface to be analysed with a beam of electrons of energy in the _________ range.

1. 1-2 KeV
2. 2-4 KeV
3. 4-8 KeV
4. 1-8 KeV

✅ Correct Answer: 1

In Auger spectroscopy, beam currents are typically _____ in a beam of diameter 0.5mm.

1. 5-10 µA
2. 5-20 µA
3. 5-30 µA
4. 5-50 µA

✅ Correct Answer: 4

Which of the following is the detection limit of Auger Electron Spectroscopy?

1. 0.1% monolayer
2. 0.5% monolayer
3. 1% monolayer
4. 2% monolayer

✅ Correct Answer: 2

Which of the following denotes the sample destruction that occurs in Auger electron spectroscopy?

1. None in 95% of sample
2. None in 99% of sample
3. None in 100% of sample
4. Frequent

✅ Correct Answer: 4

How is the specificity of Auger electron spectroscopy?

1. Very bad
2. Bad
3. Good
4. Very good

✅ Correct Answer: 3

AES is more sensitive than XPS because of which of the following factors?

1. Binding energies of electrons
2. Kinetic energies of electrons
3. Mass of electrons
4. Mass to charge ratio of electrons

✅ Correct Answer: 2

A basic X-ray source includes which of the following components?

1. Large target anode
2. Large target cathode
3. Small target anode
4. Small target cathode

✅ Correct Answer: 1

The anode is held at __________ positive potential and the filament is held at ____________ potential.

1. High, ground
2. Ground, high
3. Low, high
4. High, low

✅ Correct Answer: 1

Which of the following is one of the most commonly used anode material?

1. Carbon
2. Tungsten
3. Magnesium
4. Cesium

✅ Correct Answer: 3

Which is the most intense line in the X-ray spectrum?

1. Kα1
2. Kα2
3. Kα12
4. Kα22

✅ Correct Answer: 3

Which of the following must be used with the X-ray source to have high energy resolution?

1. Chopper
2. Vacuum chamber
3. Accelerator
4. Monochromator

✅ Correct Answer: 4

Magnetic deflection energy analysers are effective than electrostatic types.

1. True
2. False
3. all of the above
4. None of the mentioned

✅ Correct Answer: 1

Double-pass cylindrical mirror energy analyser has how many mirrors?

1. One
2. Two
3. Three
4. four

✅ Correct Answer: 2

In spherical sector analyser, ____ is detected and plotted as a function of energy.

1. Mass
2. Charge
3. Number of electrons striking the detector
4. Mass to charge ratio of electrons

✅ Correct Answer: 3

Which of the following is the most commonly used detector in ESCA and AES?

1. Electron multiplier
2. Dynodes
3. Photovoltaic cell
4. Photomultiplier

✅ Correct Answer: 1

Electron detector has a _______ doped glass tube with a secondary semiconducting coating.

1. Quartz
2. Silica
3. Lead
4. Cesium

✅ Correct Answer: 3

The output of the multiplier is fed to which of the following immediately?

1. Pulse amplifier discriminator
2. DAC
3. ADC
4. Multichannel analyser

✅ Correct Answer: 1

Which of the following is the ideal vacuum for electron spectrometers?

1. 10-6 torr
2. 10-7 torr
3. 10-8 torr
4. 10-9 torr

✅ Correct Answer: 1

Which of the following is the most commonly used magnetic shielding?

1. Helmholtz coils
2. Ferro-magnetic shielding
3. Faraday shield
4. Magnetometer probe

✅ Correct Answer: 2

Charging effect can be suppressed by supplying flood of electrons having which of the following?

1. Uniform low energy
2. Uniform low mass
3. Uniform high energy
4. Uniform high mass

✅ Correct Answer: 1

Synchroton radiation has several advantages over conventional radiation.

1. True
2. False
3. all of the above
4. None of the mentioned

✅ Correct Answer: 1

In Ion spectroscopy, the primary ion is usually which of the following?

1. Inert gas ion
2. Halogen ion
3. Oxygen group gas ion
4. Hydrogen

✅ Correct Answer: 1

The kinetic energy of the primary ion should be in which of the following range?

1. 0.1-4 keV
2. 0.2-1 keV
3. 0.4-2 keV
4. 0.3-5 keV

✅ Correct Answer: 4

If the primary ion is elastically scattered, the kinetic energy of the reflected primary ion will depend on which of the following?

1. Charge of the primary ion
2. Charge of the surface ion
3. Mass of the surface ion
4. Number of surface ions

✅ Correct Answer: 3

Which of the following causes the phenomena of sputtering?

1. Primary ion gets embedded in the solid
2. Primary ion is elastically scattered
3. Primary ion is reflected
4. Primary ion is refracted

✅ Correct Answer: 1

The fragments formed during sputtering can be either neutral atoms or ions. The ions can only be positive.

1. True
2. False
3. all of the above
4. None of the mentioned

✅ Correct Answer: 2

Which of the following is the energy range of ISS?

1. 1 keV
2. 2 keV
3. 4 keV
4. 8 keV

✅ Correct Answer: 1

Which of the following is the spectral range of SIMS?

1. 0-10 amu
2. 0-100 amu
3. 0-500 amu
4. 0-1000 amu

✅ Correct Answer: 3

Both ISS and SIMS have depth profiling capability.

1. True
2. False
3. all of the above
4. None of the mentioned

✅ Correct Answer: 1

Which of the following is denotes the absolute quantitative analysis of SIMS?

1. 30%
2. 70%
3. 50%
4. Not possible

✅ Correct Answer: 4

Which of the following is the amount of matrix effect that occurs in SIMS?

1. Very low
2. Low
3. Some
4. Severe

✅ Correct Answer: 4

Which of the following is the x-y resolution of ISS?

1. 1 µ
2. 10 µ
3. 100 µ
4. 1000 µ

✅ Correct Answer: 3

Which of the following is the x-y resolution of SIMS?

1. 1 µ
2. 10 µ
3. 100 µ
4. 1000 µ

✅ Correct Answer: 1

In ion spectroscopy, the positive ions are focussed on the sample at which of the following angles?

1. 20o
2. 30o
3. 45o
4. 90o

✅ Correct Answer: 3

Only those electrons which are in a selected small solid angle are received in the ________ electrostatic analyser.

1. 100o
2. 127o
3. 180o
4. 263o

✅ Correct Answer: 2

Which of the following can be used as the detector in ion spectroscopy?

1. Faraday cup collector
2. Channel electron multiplier
3. Micro-channel plate
4. Flame ionization detector

✅ Correct Answer: 2

In order to obtain ISS spectra, the backscattered primary ions are sampled by which of the following?

1. Faraday cup analyser
2. Photographic analyser
3. Micro-channel analyser
4. Cylindrical mirror analyser

✅ Correct Answer: 4

Which of the following is the energy after collision with a surface atom for a scattering angle of 90o when Eo is the energy of the incident ion, M1 is the mass of the incident ion and M2 is the mass of the target surface?

1. Eo(M2-M1)/(M2+M1)
2. Eo(M2+M1)/(M2-M1)
3. Eo(M2×M1)/(M2+M1)
4. Eo(M2-M1)/(M2×M1)

✅ Correct Answer: 1